Application SupportWith our application support we assist you with method developments and further applications, each tailored to your specific problem. Investigation technologies for surfaces/interfaces and multilayersInvestigations with IR spectroscopic methods and microscopic technologies: ATR, Attenuated Total Reflection
DRIFT, Diffuse Reflection Infrared Fourier Transformation Direct Reflection (Grazing Angle)
IR-Imaging/IR-Microscopy combined with (Focal Plane) Array Detector
SEM (Scanning-Electron-Microscopy) with Energy-Dispersive X-ray Spectroscopy (EDS, also abbreviated EDX or XEDS)
Light and stereo microscopy, confocal microscopy (external cooperation partner) AFM, Atomic Force Microscopy (external cooperation partner) General analytical problems or questions
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