Application Support

Investigations with IR spectroscopic methods and microscopic technologies:

ATR, Attenuated Total Reflection

DRIFT, Diffuse Reflection Infrared Fourier Transformation

Direct Reflection (Grazing Angle)

IR-Imaging/IR-Microscopy combined with (Focal Plane) Array Detector

SEM (Scanning-Electron-Microscopy) with Energy-Dispersive X-ray Spectroscopy (EDS, also abbreviated EDX or XEDS)

Light and stereo microscopy, confocal microscopy (external cooperation partner)

AFM, Atomic Force Microscopy (external cooperation partner)

General analytical problems or questions

• Sample preparation/handling suitable for measurement (for samples from QC, process monitoring, research)
• Application of the optimal IR method. In addition to ATR, DRIFT, etc., IR spectra can be recorded in transmission or with gas or flow cells.
• Identification of unknown components (IR structure elucidation and/or database searches)
• Quantification of chemical components on the basis of reference substances
• Method development, IR database construction adapted to your processes / analytical environment