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Application Support

Investigation technologies for surfaces/interfaces and multilayers

Investigations with IR spectroscopic methods and microscopic technologies:

ATRAttenuated Total Reflection

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DRIFT, Diffuse Reflectance Infrared Fourier Transformation

Direct Reflection (Grazing Angle)

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IR-Imaging/IR-Microscopy combined with (Focal Plane) Array Detector

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SEM (Scanning-Electron-Microscopy) with Energy-Dispersive X-ray Spectroscopy (EDS, also abbreviated EDX or XEDS)

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Light and stereo microscopy, confocal microscopy (external cooperation partner)

AFM, Atomic Force Microscopy (external cooperation partner)

General analytical problems or questions

  • Sample preparation/handling suitable for measurement (for samples from QC, process monitoring, research)
  • Application of the optimal IR method. In addition to ATR, DRIFT, etc., IR spectra can be recorded in transmission or with gas or flow cells.
  • Identification of unknown components (IR structure elucidation and/or database searches)
  • Quantification of chemical components on the basis of reference substances
  • Method development, IR database construction adapted to your processes / analytical environment

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Portmann Instruments AG
Gewerbestrasse 18
CH-4105 Biel-Benken
Phone 061 726 65 55
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